News

Press Release

Jan 2014 Merger by Advantest Corporation
May 2012 Test Burn-in System "B6700" New Release
Jul 2011 Test Burn-in System "P3506" New Release
Mar 2011 Press Release -About Northeast Japan Earthquake
Nov 2010 Flash Memory Test System "B8502/B8502ES" New Release
Nov 2010 Test Burn-in System "P3505" New Release
Nov 2009 Flash Memory Test System "B8501ES" New Release
May 2008 Wafer Level Burn-In System "B2510" New Release
Dec 2006 Memory Test During Burn-in System "B6511" New Release